The microelectronics FA event of the year is in San Jose, California, USA

Conference: November 3-7, 2013
Exposition: November 5-6, 2013

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Technical symposia, user groups, seminars, short courses, and the largest equipment exposition in the industry make ISTFA the best place to learn, network, and further your career!

Expand failure analysis and empower innovation.

This special preview showcases the latest technology and advancements in the failure analysis industry for ISTFA attendees. See industry innovations firsthand on the ISTFA Expo Floor as well as brand new equipment and services.

Check out 2012 presentations now!

Congratulations to the authors of the ISTFA 2012 Best and Outstanding Papers!

Best Paper: FemtoFarad/TeraOhm Endpoint Detection for Microsurgery of Integrated Circuit Devices
Mr. Jim Colvin, FA Instruments, San Jose, CA

Outstanding Paper: Advanced Physical Analysis Methodologies for Yield and Reliability of 28-nm, Bulk-Si, Flip-Chip ICs using SEM and Backside Deprocessing
Dr. Yuanjing (Jane) Li, Steven Scott and Howard Lee Marks, Silicon Failure Analysis Lab, nVIDIA Corporation, Santa Clara, CA


 

 

ASM 100th Anniversary
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Battelle

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Thermo-Cal

ASM 100th Anniversary
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Digit Concept

Industry Sponsor:

Left Coast Instruments

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Allied

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IR Labs

Mentor Graphics

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Synopsus

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Zeiss

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Electronic Device Failure Analysis Society

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